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Intermittent Contact AFM

Tapping Mode AFM Image

Intermittant contact AFM enables the measurement of in-plane as well as out-of-plane properties of materials. The tapping mode phase image on the left shows crystalline domains of a PDA monolayer on mica. The phase image reveals the underlying shear and friction properties of the surface.

Selected publications on this topic:

"Distance Dependence of Neuronal Growth on Nanopatterned Gold Surfaces." C. Staii, C. Viesselmann, J. Ballweg, J. C. Williams, E. W. Dent, S. N. Coppersmith, and M. A. Eriksson, Langmuir 27, 233 (2011). [Journal Article]

"Positioning and guidance of neurons on gold surfaces by directed assembly of proteins using Atomic Force Microscopy." C. Staii, C. Viesselmann, J. Ballweg, L. Shi, G. -Y. Liu, J. C. Williams, E. W. Dent, S. N. Coppersmith, and M. A. Eriksson, Biomat. 30, 3397 (2009). [Journal Article]

"Quantitative analysis of electric force microscopy: The role of sample geometry." Emma Tevaarwerk, D. G. Keppel, P. Rugheimer, M. G. Lagally, and M. A. Eriksson, Rev. Sci. Instrum. 76, 053707 (2005). [Journal Article]

"Phase imaging and the lever-sample tilt angle in dynamic atomic force microscopy." Matthew J. D'Amato, Matthew S. Marcus, M. A. Eriksson, and Robert W. Carpick, Appl. Phys. Lett. 85, 4738 (2004). [Journal Article]

"Measurements of in-plane material properties with scanning probe microscopy." Robert W. Carpick and M. A. Eriksson, MRS Bulletin 29, 472 (2004). [Journal Article]

"Polydiacetylene films: a review of recent investigations into chromogenic transitions and nanomechanical properties." Robert W. Carpick, Darryl Y. Sasaki, Matthew S. Marcus, M. A. Eriksson, and Alan R. Burns, J. Phys.: Cond. Matt 16, 679 (2004). [Journal Article]

"Electrically isolated SiGe quantum dots." Emma Tevaarwerk, P. Rugheimer, O. M. Castellini, D. G. Keppel, S. T. Utley, D. E. Savage, M. G. Lagally, and M. A. Eriksson, Appl. Phys. Lett. 80, 4626 (2002). [Journal Article]

"Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy." Matthew S. Marcus, Robert W. Carpick, Darryl Y. Sasaki, and M. A. Eriksson, Phys. Rev. Lett. 88, 226103 (2002). [Journal Article]

"Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes." T. Larsen, K. Moloni, F. Flack, M. A. Eriksson, M. G. Lagally, and C. T. Black, Appl. Phys. Lett. 80, 1996 (2002). [Journal Article]

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